ThetaMetrisis will exhibit its products & activities in the XXXII Panhellenic Conference on Solid State Physics & Materials Science at Ioannina, Greece (18-21, September 2016).

We are looking forward to your visit at our booth where live demonstrations and presentation of our technological solutions for thin film and coating characterization will take place.

Come and drive:

FR-pOrtable, OUR NEW INEXPENSIVE, PORTABLE, ULTRA-FAST AND USB-BASED FILM MEASUREMENT SYSTEM

Do not hesitate to bring your samples for a live demonstration of our systems’ performance ………..

 

 

 

 

ThetaMetrisis will exhibit its products & activities during SPIE Photonics West 2016 at the Moscone Center, San Francisco, California, USA (16-18, February 2016).

We are looking forward to your visit at ThetaMetrisis's booth #6035 where live demonstrations and presentation of our technological solutions for thin film and coating characterization will take place.

Come and drive:

FR-pOrtable, OUR NEW INEXPENSIVE, PORTABLE, ULTRA-FAST AND USB-BASED FILM MEASUREMENT SYSTEM

FR-Scanner, OUR ULTRA-FAST SCANNER for thickness & optical properties mapping of coatings

Do not hesitate to bring your samples for a live demonstration of our systems’ performance ………..

 

  SPIE Photonics West 2014

 

 

ThetaMetrisis participates in the Nanotexnology 2015 International Conferences & Exhibition on Nanotechnologies and Organic Electronics, 6-10 July 2015, Thesssaloniki, Greece.


At the exhibition of the conference FR-pOrtable and FR-Basic will be demonstrated and characterization of samples will be carried out for conference participants


 
 

ThetaMetrisis will exhibit its products & activities during All-About-Photonics 2014 at Pacifico, Yokohama, Japan (15-17, October 2014).

 

We are looking forward to your visit at Autex's booth where live demonstrations and presentation of our technological solutions for thin film and coating characterization will take place.

 

Come and drive FR-pOrtable, OUR NEW INEXPENSIVE, PORTABLE, ULTRA-FAST AND USB-BASED FILM MEASUREMENT SYSTEM

 

Do not hesitate to bring your samples for a live demonstration of our systems’ performance ………..

FR-pOrtable All-About-Photonics 2014

 

 

ThetaMetrisis will exhibit its products & activities during Europt(o)de 2014 conference on Optical Chemical and Bio Sensors at the Royal Olympic Hotel, Athens, Greece (13-16, April 2014).

 

We are looking forward to your visit at our booth where live demonstrations and presentation of our technological solutions for thin film and coating characterization will take place.

 

Come and drive FR-pOrtable, OUR NEW INEXPENSIVE, PORTABLE, ULTRA-FAST AND USB-BASED FILM MEASUREMENT SYSTEM

 

Do not hesitate to bring your samples for a live demonstration of our systems’ performance ………..

FR-pOrtable Europt(r)ode 2014

 

 

ThetaMetrisis will exhibit its products & activities during SPIE Photonics West 2014 at the Moscone Center, San Francisco, California, USA (4-6, February 2014).

We are looking forward to your visit at South Hall ABC, stand 3082 where live demonstrations and presentation of our technological solutions for thin film and coating characterization will take place.

Come and drive FR-pOrtable, OUR NEW INEXPENSIVE, PORTABLE, ULTRA-FAST AND USB-BASED FILM MEASUREMENT SYSTEM

Do not hesitate to bring your samples for a live demonstration of our systems’ performance ………..

You can download your Exhibition pass at http://spie.org/Documents/Exhibitions/pw/PW14Epostcard.htm

 

FR-pOrtable SPIE Photonics West 2014

 

 

ThetaMetrisis participates in the exhibition of Panhellenic Conference on Solid State Physics and Materials Sciences, at Patras Greece, 23-26th September 2012


At the exhibition FR-tools will be demonstrated and characterization of samples will be carried out for conference participants

 
ThetaMetrisis participates in the exhibition of Panhellenic Conference on Solid State Physics and Materials Sciences, at Athens Greece, 22-25 September 2013 (NCSR Demokritos conference center)


At the exhibition FR-tools will be demonstrated and characterization of samples will be carried out for conference participants

   
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