ThetaMetrisis will exhibit its products & activities during SPIE Photonics West 2016 at the Moscone Center, San Francisco, California, USA (16-18, February 2016).

We are looking forward to your visit at ThetaMetrisis’s booth #6035 where live demonstrations and presentation of our technological solutions for thin film and coating characterization will take place.

Come and drive:

FR-pOrtable, OUR NEW INEXPENSIVE, PORTABLE, ULTRA-FAST AND USB-BASED FILM MEASUREMENT SYSTEM

FR-Scanner, OUR ULTRA-FAST SCANNER for thickness & optical properties mapping of coatings

Do not hesitate to bring your samples for a live demonstration of our systems’ performance ………..