FR-pOrtable is a unique USB-powered solution for accurate & precise non-destructive characterization of transparent and semi-transparent single films or stack of films. FR-pOrtable can perform reflectance & transmittance measurements in the 370-1020nm spectral range.

The compact design of FR-pOrtable, guarantees highly accurate and repeatabley of measurements. FR-pOrtable, can be either mounted on the supplied stage or can be easily transformed to a handheld thickness measurement tool to be placed over the area under characterization. This way, FR-pOrtable is the only optical characterization tool for in-field applications.

Reflectance, Transmittance, Absorption and Color parameters can be measured



Thickness Measurement Range 12nm-90um Light Source LifeTime 20.000hours
Refractive Index Calculation  YES (>100nm thick) Wavelength Resolution 0.8nm
Thickness measurement Accuracy  0.2% or 1nm  Layers to be Characterized  5 (simultaneous)
Thickness measurement Precision  0.05nm or 1‰ (0.01nm)  Measurement Time (Min)   5msec
Thickness measurement stability  0.06nm  Spectrometer  3648pixels, 16bit
Sample size  1mm to 300mm and up  Power  USB-Supplied
Spectral Range  370-1020nm  Dimensions  300mm x 110mm x 40mm
Working Distance  3-20mm  Weight  600gr
Spot Size  1.0-4.0mm    


FR-pOrtable Brochure


Typical Measurements with FR-pOrtable

 10nm Si3N4 layer on Si wafer  84nm TiO2 layer on microscope glass  110nm PMMA layer on Si wafer
 2462.9nm TEOS on Si wafer (RI calc)  48.7μm SU-8 resist film on Si wafer 162.4nm Si3N4/990.1nm SiO2 on Si wafer




At-the-Field adaptor: For measurements at the Point-of-Need.
Transmittance module: For the measurement of transmittance & absorbance of coatings, coating thickness etc.
Manual X-Y stage: For the characterization of coatings at multiple positions (manual movement)

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