FR-pOrtable is a unique USB-powered solution for accurate & precise non-destructive characterization of transparent and semi-transparent single films or stack of films. FR-pOrtable can perform reflectance & transmittance measurements in the 370-1020nm spectral range.
The compact design of FR-pOrtable, guarantees highly accurate and repeatabley of measurements. FR-pOrtable, can be either mounted on the supplied stage or can be easily transformed to a handheld thickness measurement tool to be placed over the area under characterization. This way, FR-pOrtable is the only optical characterization tool for in-field applications.Reflectance, Transmittance, Absorption and Color parameters can be measured
|Thickness Measurement Range
|Light Source LifeTime
|Refractive Index Calculation
|YES (>100nm thick)
|Thickness measurement Accuracy
|0.2% or 1nm
|Layers to be Characterized
|Thickness measurement Precision
|0.05nm or 1‰ (0.01nm)
|Measurement Time (Min)
|Thickness measurement stability
|1mm to 300mm and up
|300mm x 110mm x 40mm
|10nm Si3N4 layer on Si wafer
|84nm TiO2 layer on microscope glass
|110nm PMMA layer on Si wafer
|2462.9nm TEOS on Si wafer (RI calc)
|48.7μm SU-8 resist film on Si wafer
|162.4nm Si3N4/990.1nm SiO2 on Si wafer
At-the-Field adaptor: For measurements at the Point-of-Need.
Transmittance module: For the measurement of transmittance & absorbance of coatings, coating thickness etc.
Manual X-Y stage: For the characterization of coatings at multiple positions (manual movement)