The versions 2.0 of FR-Monitor software was released on February 15th, 2013

FR-Monitor, our software for the control of FR-tools and the measurement of thickness(es) and optical properties of film stacks has reached version 2.0. This version offers a great number of advantages a small fraction of which are:

• CPU time needed for fitting has been reduced by almost an order of magnitude
• The procedure for acquiring reference spectra has been modified and the possibility to use aluminum and silicon substrates has been added
• New models for the measurement of ultra thick films were added
• Navigation in the layer stack at a more user friendly way
• 32-bit and 64-bit Windows operating Systems are both supported
• Extended Materials Database New format (ex2) substitutes the exp format of former FR-Monitor versions.

For more information please contact the technical support at: techsupport@thetametrisis.com