FR-pOrtable is a unique USB-powered solution for accurate & precise non-destructive characterization of transparent and semi-transparent single films or stack of films. FR-pOrtable can perform reflectance & transmittance measurements in the 370-1020nm spectral range.
The compact design of FR-pOrtable, guarantees highly accurate and repeatabley of measurements. FR-pOrtable, can be either mounted on the supplied stage or can be easily transformed to a handheld thickness measurement tool to be placed over the area under characterization. This way, FR-pOrtable is the only optical characterization tool for in-field applications.Reflectance, Transmittance, Absorption and Color parameters can be measured
|Thickness Measurement Range||12nm-90um||Light Source LifeTime||20.000hours|
|Refractive Index Calculation||YES (>100nm thick)||Wavelength Resolution||0.8nm|
|Thickness measurement Accuracy||0.2% or 1nm||Layers to be Characterized||5 (simultaneous)|
|Thickness measurement Precision||0.05nm or 1‰ (0.01nm)||Measurement Time (Min)||5msec|
|Thickness measurement stability||0.06nm||Spectrometer||3648pixels, 16bit|
|Sample size||1mm to 300mm and up||Power||USB-Supplied|
|Spectral Range||370-1020nm||Dimensions||300mm x 110mm x 40mm|
|10nm Si3N4 layer on Si wafer||84nm TiO2 layer on microscope glass||110nm PMMA layer on Si wafer|
|2462.9nm TEOS on Si wafer (RI calc)||48.7μm SU-8 resist film on Si wafer||162.4nm Si3N4/990.1nm SiO2 on Si wafer|
At-the-Field adaptor: For measurements at the Point-of-Need.
Transmittance module: For the measurement of transmittance & absorbance of coatings, coating thickness etc.
Manual X-Y stage: For the characterization of coatings at multiple positions (manual movement)